AMTA Paper Archive


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AMTA Paper Archive

Satellite and satellite antenna testing with high speed electronics
D.W. Hess,C.B. Brechin, November 1993

This presentation offers some examples of performance in accomplishing high volume testing under the rigorous technical constraints imposed by the satellite industry. As an example of a high speed system, the Scientific-Atlanta Model 2095 will be used to illustrate the capability offered by today's technology. This system has found applicatio0n in the facilities of five satellite manufacturers constructed within the past three years and is proven by its demonstrated application in satellite programs.

Superresolution ISAR imaging techniques
E. Walton,I.J. Gupta, November 1993

This paper demonstrates modem parametric modeling techniques that can be used to form high resolution ISAR images of full scale flying aircraft. Both parametric spectral estimation techniques and autoregressive data extrapolation techniques are shown. We demonstrate imaging. In each case, the modem spectral estimation or data extrapolation techniques produce higher image resolution than that which is obtained by classical Fourier techniques.

Superresolution analysis of frequency-dispersive scattering
A. Moghaddar,E. Walton, Y. Ogawa, November 1993

A Superresolution technique for estimation of the time-delays, and amplitude/phase dispersion of the electromagnetic scattering is presented. In order to estimate the frequency dependence of individual scattering features, a pre-processing technique for the MUSIC (Multiple SIgnal Classification) algorithm is developed and applied to the theoretical and experimental scattering data.

High resolution radar imaging using data extrapolation
I.J. Gupta,M. Beals, November 1993

Effectiveness of data extrapolation to generate high resolution radar images is studied. It is shown that polar formatted scattered field data can be extrapolated more effectively than (f, 0) domain scattered field data. The reason for this is that the forward backward linear prediction is not suitable for extrapolating the scattered field data with respect to aspect angle (0). Also, when the scattered field data is extrapolated with respect to frequency to increase the down range resolution, there can be some degradation in the cross range resolution.

Vertical bistatic RCS measurements in the MDTI radar measurement center
J.,D. Weatherington, November 1993

This paper demonstrates vertical bistatic Radar-Cross-Section measurement capability in the McDonnell Douglas Technologies, Inc. (MDTI) Radar Measurement Center )RMC). Data will be presented showing the system configuration, system specifications, and predicted and measured vertical bistatic RCF data on a variety of generic targets.

High speed antenna measurement systems for S.A.R. applications.
P. Garreau,G. Cottard, J. Ch. Bolomey, November 1993

Data collection for Synthetic Aperture Radar (SAR) antenna measurements is increasingly making measurement stages very time consuming. This paper presents the capabilities of fast Planar Near Field (PNF) instruments using a linear modulated probe array. It demonstrates the possibilities to decrease the classical near field mechanical scan time by a factor ranging from 100 to 1000. Emphasis is given to the advantages of this technique for multi parameter antenna measurements.

Scattering by a simplified ship deckhouse model
C.R. Birtcher,E.R. Bonsen, J.T. Aberle, November 1993
What is RCS in an image?
G Fliss,D. Mensa, W. Nagy, November 1993

Extracting absolute RCS levels from radar images has become a prevalent practice, but is it valid? Scattering strengths associated with pixels in radar images are derived from responses of the target averaged over frequency and aspect angle. This paper presents theoretical and experimental data for simple and complex targets with frequency-and angle-dependent scattering to illustrate differences between results of narrowband and wideband RCS measurements.

Algorithm for editing RFI from antenna measurements
R.B. Dybdal,G.M. Shaw, November 1993

Techniques for editing RFI from antenna measurements are developed for vector network analyzer instrumentation, and include the processing within the analyzer. An algorithm was devised for identifying data that may contain RFI; this algorithm is based on the electrical size of the antenna. Once data containing RFI are identified, extrapolation techniques based on the electrical size of the antenna are used to produce continuous data.

Dual-frequency,dual-polarized millimeter wave antenna characterization
J.P. Kenney,D. Mooradd, E. Martin, L.D. Poles, November 1993

The radiation characteristics for a dual-frequency, dual-polarized millimeter wave antenna for a radar operating at 33 and 95-GHz were measured at the Ipswich Research Facility. On-pole and cross-pole radiation patterns were measured using the 2600 foot far field range. In this paper we'll discuss the general design of the antenna feed system and the instrumentation ensemble used to perform the far field characterization of this high performance large aperture dielectric lens antenna.

Free space characterization of materials
D. Blackham, November 1993

A simple change to the HP8510C or HP8720C vector network analyzer block diagram coupled with the TRM (Thru Reflect Match) calibration leads to accurate measurements of the material properties of flat samples. Algorithms developed for transmission line measurements can also be used in free space measurements. A description of recent improvements in the transmission/reflection algorithms is reviewed. Free space measurement results based on the transmission/reflection algorithms found in the HP85071B materials measurement software package are presented.

Remote thickness sensor
W.S. Arceneaux, November 1993

Applications that require tight tolerances on dielectric thickness control need accurate sensors. A technique has been developed that will allow for the measurement of thickness without requiring surface contact. High resolution radar imaging, commonly used in RCS measurements , is now being used to measure thickness. Electromagnetic fields reflected from the front and rear surface are detected and the time response delta is converted into thickness. A major advantage of this method is that it is not affected by varying sensor offset height.

Automated test sequencer for high volume near-field measurements, An
G. Hindman,D. Slater, November 1993

Test sequencing flexibility and high throughput are essential ingredients to a state-of-the-art near-field test range. This paper will discuss methods used by NSI to aid the operator through the near-field measurement process. The paper will describe NSI's expert system and customer applications of a unique test and processing sequencer developed by NSI for optimizing range measurement activities. The sequencer provides powerful control of software functions including multiplexed measurements, data processing and unattended test operations.

Portable RCS diagnostic system
R. Harris,B. Freburger, D. Maffei, R. Redman, November 1993

This paper describes the most recent version of the Model 200 portable RCS diagnostic radar. The Model 200 was designed to provide high-resolution RCS measurements in unprepared rooms indoors as well as on outdoor ranges. The system can provide real aperture measurements, ISAR measurements, or SAR measurements without changing system configuration.

Ground-to-air RCS diagnostic system
R. Harris,A. Strasel, B. Freburger, C. Zappala, M. Lewis, R. Redman, November 1993

The initial phase of METRATEK's new Model 300 Radar System has been installed at the Navy's Chesapeake Tests Range (CTR) at Patuxent River, MD. This ground-to-air Multimode, Multifrequency Instrumentation Radar System (MMIRS) is a high-throughput frequency-and-polarization agile radar that is designed to drastically reduce the cost of measuring the radar cross section of airborne targets by allowing simultaneous measurements to be made at VHF through Ku Band.

High duty instrumentation radar transmitters
F.A. Miller, November 1993

Today's requirements for dynamic Radar Cross Section (RCS) test data set new demands upon instrumentation Radar systems. Transmitters must deliver high power and operate at high data rates. Additionally, noise floor reduction of coherent spurious signals improves raw data and minimizes the need for manipulation of data.

Evaluation of compact ranges for low sidelobe antenna measurements
I.J. Gupta,W.D. Burnside, November 1993

A method is presented to qualify a compact range measurement system for low sidelobe antenna measurements. The method uses the target zone fields (probe data) of the compact range. Using the method, one can identify the angular regions around which the measurement errors can be significant. The sidelobe levels which can be measured around these angular regions with less than a 3 dB error are also defined.

Demonstration of bistatic electromagnetic scattering measurements by spherical near-field scanning, A
M.G. Cote,R.M. Wing, November 1993

The far-field radar cross section (RCS) of a conducting sphere is obtained by transforming scattered near-fields measured on a spherical surface. A simple and convenient calibration procedure is described that involves measuring the incident field directly at the target location. Although a non probe-corrected transmission formula was used in this study the importance of prove correction in practice is demonstrated.

Analytic spherical near field to near/far field transformation, An
T.K. Sarkar,A. Taaghol, P. Petre, R.F. Harrington, November 1993

An efficient and accurate spherical near field to far field transformation without probe correction is presented. The indices m of the Legendre polynomials is summed up analytically, thereby reducing the computation time. Computations with both synthetic and experimental data illustrate the accuracy of this technique.

Simplified polarization measurements
E. Gordon, November 1993

The mathematical language of wave polarization has been somewhat cryptic; usually involving vectors, tensors, or complex numbers or symbolic equations. By using the Poincare' sphere and dot product multiplication, it is possible to reduce the comutation of wave polarization mathematics to simple trigonometric formulas. Furthermore, visual representation of wave polarization on the Poincare; sphere is straight-forward and simple.







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