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Near Field

Software and hardware for spherical near-field measurement systems
D. W. Hess (Scientific-Atlanta, Inc.),C. Green (Scientific-Atlanta, Inc.), B. Melson (Scientific-Atlanta, Inc.), J. Proctor (Scientific-Atlanta, Inc.), J. Jones (Scientific-Atlanta, Inc.), November 1984

The following features have been added to the spherical near-field software set which is available for the Scientific-Atlanta 2022A Antenna Analyzer. Gain Comparison Measurement Probe Pattern Measurement and Correction Thermal Drift Correction Spherical Modal Coefficient Analysis Far-Field, Radiation Intensity, and Polarization Display The addition of the probe pattern correction permits antenna measurements to be made at range lengths down to within several wavelengths of touching. The addition of probe polarization measurement permits three antenna polarization measurements to be made and analyzed as well as two antenna polarization transfer measurements. Correction for phase and amplitude errors attributable to thermal drift is accomplished by the return-to-peak method. Reduction of antenna patterns to spherical modal coefficients is an essential feature of spherical near-field to far-field transforms and is offered as an augmentation to antenna design. Far field display features permit the far fields of antennas to be presented in both component and radiation intensity formats, in circular, linear and canted linear polarization components.

The Determination of near-field correction parameters for circularly polarized probes
A. C. Newell (Electromagnetic Fields Division),D. P. Kremer (Electromagnetic Fields Division), M.H. Francis (Electromagnetic Fields Division), November 1984

In order to accurately determine the far-field of an antenna from near-field measurements the receiving pattern of the probe must be known so that the probe correction can be performed. When the antenna to be tested is circularly polarized, the measurements are more accurate and efficient if circularly polarized probes are used. Further efficiency is obtained if one probe is dual polarized to allow for simultaneous measurements of both components. A procedure used by the National Bureau of Standards for determining the plane-wave receiving parameters of a dual-mode, circularly polarized probe is described herein. First, the on-axis gain of the probe is determined using the three antenna extrapolation technique. Second, the on-axis axial ratios and port-to-port comparison ratios are determined for both the probe and source antenna using a rotating linear horn. Far-field pattern measurements of both amplitude and phase are then made for both the main and cross components. In the computer processing of the data, the on-axis results are used to correct for the non-ideal source antenna polarization, scale the receiving coefficients, and correct for some measurement errors. The plane wave receiving parameters are determined at equally spaced intervals in k-space by interpolation of the corrected pattern data.

Preliminary development of a phased array near field antenna coupler
D. D. Button (Sanders Associates, Inc.), November 1984

End-to-end testing of electronic warfare (EW) equipment at the organizational or flight lines level is accomplished by use of an antenna coupler which is placed over the EW system antenna. The coupler is used to inject a stimulus signal simulating a signal emanating from a distant radar, and to receive and detect the EW system response (EW transmit) signal. The coupler is used to determine the EW receiver sensitivity over a swept frequency coverage and the EW transmit gain and effective radiated power (ERP) versus frequency characteristics, as well as to determine the operating integrity of the EW antenna and transmission lines.

Ultra low sidelobe testing by planar near field scanning
K. R. Grimm (Technology Service Corporation), November 1984

An innovative technique has been developed for accurately measuring very low Sidelobe Antenna patterns by the method of planar near field probing. The technique relies on a new probe design which has a pattern null in the direction of the test antenna’s steered bean direction. Simulations of the near field measurement process using such a probe show that -60dB peak side-lobes will be accurately measured (within established bounds) when the calibrated near field dynamic range does not exceed 40 dB. The desireable property of the new probe is its ability to “spatially filter” the test antenna’s spectrum by reduced sensitivity to main beam ray paths. In this way, measurement errors which usually increase with decreasing near field signal level are minimized. The new probe is also theorized to have improved immunity to probe/array multipath and to probe-positioning errors. Plans to use the new probe on a modified planar scanner during tests with the AWACS array at the National Bureau of Standards will be outlined.

Characteristics and Capabilities of the Lewis Research Center high precision 6.7- by 6.7-M planar near-field scanner
G.R. Sharp (NASA),C.A. Raquet (NASA), R.E. Alexovich (NASA), R.J. Zakrajsek (NASA), R.R Kunath (NASA), November 1984

The development of advanced spacecraft communication antenna systems is an essential part of NASA’s satellite communications base research and technology program. The direction of future antenna technology will be toward antennas which are large, both physically and electrically; which will operate at frequencies of 60 GHz and above; and which are nonreciprocal and complex, implementing multiple beam and scanning beam concepts that use monolithic semiconductor device technology. The acquisition of accurate antenna performance measurements is a critical part of the advanced antenna research program and represents a substantial antenna measurement technology challenge, considering the special characteristics of future spacecraft communications antennas.

A New antenna test facility at General Electric Space Systems Division in Valley Forge, PA.
R. Meier (General Electric Co.), November 1984

This paper describes the new antenna test facility under construction at General Electric Space Systems Division in Valley Forge, PA. The facility consists of a shielded anechoic chamber containing both a Compact Range and a Spherical Near-Field Range. In addition, it provides for a 700’ boresight range through an RF transparent window. The facility will be capable of testing antenna systems over a wide frequency range and will also accommodate an entire spacecraft for both system compatibility and antenna performance tests.

Antenna calibration at the TUD-ESA spherical near-field range
F. Holm Larsen (Technical University of Denmark),J.H. Lemanzyk (Technical University of Denmark) J.E. Hansen (Technical University of Denmark), November 1983

Since 1976 the Technical University of Denmark (TUD), sponsored by the European Space Agency (ESA), has developed a facility for spherical near-field scanning of antennas. This range has been in operation since April 1979 and has undergone continuous refinement. Some of the measurement results obtained with the facility as well was various aspects of the measuring system itself have been published from time to time (Ref. 1-5).

SNFTD - a new computer program for spherical near-field transformation
Flemming Holm Larsen (Technical University of Denmark), November 1983

As a part of the research project in Denmark on spherical near-field measurements, a number of FORTRAN programs for transformation of measured near-field data has been developed since 1976. Based on earlier work by Jensen, Wacker and Lewis, the series of programs can be summarized as follows: SNIFT (1976) Without probe correction based on a program by Lewis, NBS. Small antennas only. SNIFTB (1977) First program with probe correction. Maximum antenna diameter 25 wavelengths due to numerical instabilities. SNIFTC (1978) With probe correction. Numerically stable. Antenna size limited by the requirement that a full sphere of measured data must be contained in core memory during execution. SNIFM (1980) Segmented program with segmentation of data written for a HP1000 computer only. Antenna diameter limited to 120 wavelengths due to certain arrays in addressable memory. The new computer program is based on the experience with spherical near-field measurements at the Technical University of Denmark.

A Dual-ported, dual-polarized spherical near-field probe
J. R. Jones (Scientific-Atlanta, Inc.),D. P. Hardin (Scientific-Atlanta, Inc.), November 1983

Spherical near-field testing of antennas requires the acquisition of a great volume of data. In general, to compute the far-field of the antenna under test in any direction requires the acquisition of data at sample intervals related to the size of the antenna under test over a spherical sampling surface completely enclosing the antenna under test. This data must also be sampled as a function of probe orientation. Even for the simplest possible case, two probe orientations (or two probes) must be used.

Gain comparison measurements in spherical near-field scanning
D.W. Hess (Scientific-Atlanta, Inc.),J.R. Jones (Scientific-Atlanta, Inc.), November 1983

A set of near-field measurements has been performed by combining the methods of non-probe-corrected spherical near-field scanning and gain standard substitution. In this paper we describe the technique used and report on the results obtained for a particular 24 inch 13 GHz paraboloidal dish. We demonstrate that the gain comparison measurement used with spherical near-field scanning give results in excellent agreement with gain comparison used with compact range measurement. Lastly we demonstrate a novel utilization of near-field scanning which permits a gain comparison measurement with a single spherical scan.

Spherical surface near-field measurement
E.B. Joy (Georgia Institute of Technology), November 1983

This paper reports on research being conducted at Georgia Tech on the spherical surface near-field measurement technique. The popularity of the spherical surface near-field measurement technique is indicated in the list of near-field ranges as shown in Table I. This popularity is, in large part, due to the availability of the scientific Atlanta Spherical Near-Field Antenna Analyzer. Specifically, the paper reports on the status of (1) the Georgia Tech spherical surface near-field range, (2) comparison of non-probe compensated spherical surface near-field to far-field transformation techniques, (3) a probe position error compensation technique for spherical surface measurements, and (4) alternative spherical surface near-field to far-field transformations which include probe compensation.

An Antenna Test Range for Satellite Payload Tests
A. Saitto (European Space Agency),D.C. Patel (European Space Agency), November 1983

Conventional antenna test techniques – both far field “slant ranges” and near field – pose limitations for radiative RF testing of satellite antennas and payload systems, of increasing complexity in terms of size, operating frequencies, configurations and technology, particularly when such systems need to be evaluated in their “in-situ” locations on typical satellite platforms, in their flight configurations. Often, combination of tests and simulation has been the only recourse for evaluating system performance. In this paper, a methodology is proposed to achieve these test objectives via the use of a suitable configures, wideband, large (Quiet zone 7m x 5m x 5m), compact range for evaluation od system parameters like E.I.R.P., G/T, C/I, BER, and RF sensing performances. The test plan and evaluation schemes appropriate for these tests are elaborated to demonstrate the validity and usefulness of the approach. For some specific parameters like C/I (for a multibeam payload system) and the radar parameters (for a satellite borne radar system), it turns out that the proposed test methodologies offer the only realistic and complete tool for evaluating such system at satellite level.

A Precision optical range alignment technique
S.W. Zieg (Scientific-Atlanta), November 1982

Spherical near-field testing and other specialized antenna measurements require precise range and positioner alignment. This paper presents a method based on optical techniques to conveniently measure and monitor both range alignment and the positioner axis orthogonality and intersection. The hardware requirements consist of a theodolite and a unique target mirror assembly viewable from either side.

Field probe measurements and stray signal evaluation of a spherical near-field range
D.W. Hess (Scientific-Atlanta, Inc.), November 1982

Just as with far-field or compact ranges, it is important to evaluate spherical near-field ranges with electromagnetic field-probe measurements. Recall that the fundamental motion for utilizing the spherical near-field measurement technique is to permit antenna measurements to be made at short range lengths, relieved from the constraint of the far-field criterion. Just as the illumination function in the test zone of an ideal far-field range is a uniform planar wavefront, the ideal illumination function for a near-field range is a spherical wavefront from an elemental dipole. The field probe measurements provide a quantitative and qualitative assessment of the deviation of either a near-field or far-field range from ideal conditions.

A Simplified technique for probe position error compensation in planar surface near field measurements
E.B. Joy (Georgia Institute of Technology),R.E. Wilson (Georgia Institute of Technology), November 1982

This paper presents the results of research conducted to compensate near field measurements for known errors in near field probe position. The complete solution for probe position error compensation and associated computer algorithm developed by Corey as a Ph.D. dissertation resulted in a large computer memory and computation time requirements. Corey’s results showed, however, that the prime effect of probe positioning error was a change in the near field measurement phase in the direction of main beam propagation. It was also shown that the sinusoidal components of the probe position error produced spurious sideband propagation directions in the calculated far field patterns. This information has been used to develop a simplified probe position error compensation technique which requires negligible computer storage and computation time. An early version of this technique has recently been implemented at RCA for the Aegis near field measurement facility. The technique and sample results are presented for a small probe position errors and for a low sidelobe level antenna measurement.

Millimeter wavelength measurements of large reflector antennas
J.H. Davis (University of Texas at Austin), November 1982

An instrument has been built which allows the electromagnetic measurement of the surface accuracy of a large millimeter-wavelength antenna. The University of Texas 4.9 m radio telescope has been measured with this technique at 86.1 GHz to an accuracy of 4 µm at the surface. Our technique is an interferometric one which is fast, accurate, and able to measure the whole antenna surface at once. While the technique is illustrated by its use on a large antenna, it could be used in a near field measurement of a smaller antenna. Several antenna surface maps are presented. A comparison of run-to-run repeatability was made. The technique itself was tested by deforming the antenna surface in a known way and subsequently detecting the deformation. In addition, important factors which influence the overall error budget have been identified. These include errors in setting the antenna angular position and fluctuation noise in the atmosphere and electronics. An instrument has been built which allows the electromagnetic measurement of the surface accuracy of a large millimeter-wavelength antenna. The University of Texas 4.9 m radio telescope has been measured with this technique at 86.1 GHz to an accuracy of 4 µm at the surface. Our technique is an interferometric one which is fast, accurate, and able to measure the whole antenna surface at once. While the technique is illustrated by its use on a large antenna, it could be used in a near field measurement of a smaller antenna. Several antenna surface maps are presented. A comparison of run-to-run repeatability was made. The technique itself was tested by deforming the antenna surface in a known way and subsequently detecting the deformation. In addition, important factors which influence the overall error budget have been identified. These include errors in setting the antenna angular position and fluctuation noise in the atmosphere and electronics.

Design of a utility precision near field scanner
M.J. Drexler (Physical Science Laboratory), November 1982

This paper explored the details of the mechanical and electrical design of a multipurpose scanner. Planar, cylindrical and spherical scans as well as separation scanning (for extrapolation gain method) are accomplished by allowing any two of the five axes to be selected for program control. Special laser interferometers are available for the X-Y planar scanning. However, all axes are fitted with two-speed synchros. The method of driving and counter-weighing the X-Y probe carriage reduced the moving mass significantly which helps in the areas of start-stop agility, resonances, bearing wear and structual bending.

Cylindrical Near-Field Techniques with Application to Array Antennas
V. Jory (Georgia Institute of Technology),Donald G. Bodnar (Georgia Institute of Technology) David F. Tsao (Georgia Institute of Technology), November 1981

A cylindrical near-field antenna range has been designed, implemented and tested recently at the Cobb County Research Facility of Georgia Tech’s Engineering Experiment Station. While Georgia Tech has had an operational planar scanner since 1974 [1], the relocation of a portion of the Experiment Station to an off-campus site, together with the need for measurements of antennas not practical with the existing planar scanner, prompted the addition of a cylindrical near-field range. Provision was made in the range instrumentation for planar-polar and spherical near-field measurements. Computer software was written to effect the conversion from cylindrical near-field measurements to far-field patterns.

Configuration of spherical near-field ranges
D.W. Hess (Scientific-Atlanta, Inc.),Joseph J. Tavormina (Scientific-Atlanta, Inc.), November 1981

In principle, spherical near-field scanning measurements are performed in the same way as conventional far-field measurements except that the range length can be reduced. This provides a natural advantage to scanning in spherical coordinates over other coordinate systems due to the steady availability of equipment. However, special considerations must be given to near-field range design because of the necessity for phase measurement capability, mechanical accuracy and the need to handle large quantities of data. Based on experience with spherical near-field measurements carried out during verification testing of a spherical near-field transformation algorithm, we discuss the practical aspects of constructing a near-field range. In particular we will consider range alignment procedure, engineering of the RF signal path and times for data collection and processing.

Verification testing of a spherical near-field algorithm
D.W. Hess (Scientific-Atlanta, Inc.),Joseph J. Tavormina (Scientific-Atlanta, Inc.), November 1981

Over the past year an extensive set of verification tests has been made on a particular test antenna in order to confirm the design and operation of a spherical near-field algorithm. The measurement checks included data taken at two frequencies at three range lengths, with two coordinate orientations and with two types of probe horns. Comparisons were made against the compact range and among the various spherical near-field tests. In this talk we show examples from this program of measurements and summarize the results which demonstrate the operation of the spherical near-field scanning technique.







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