Sergiy Pivnenko, Enrique Venero, Carlo Rizzo, Belen Galocha, November 2016
In near-field antenna measurements, the pattern effect of the measuring probe represents a systematic error and thus probe pattern correction is a constitutive part of the existing processing algorithms. However, as it was shown in [1], in spherical near-field measurements, for typically used measurement distances, not exceeding two to four diameters of the measured antenna, the probe pattern effect is relatively small, and in many situations the probe pattern can be taken as that of a Hertzian dipole with the resulting effect on the measured antenna pattern being either very small or even negligible. On the other hand, for shorter measurement distances, the probe pattern effect becomes significant and omitting the probe pattern causes noticeable changes in the measured antenna pattern. It was shown in [2] by approximate simulations that in these cases applying the correction using the probe pattern not at the measured frequency, but at the center frequency of a standard waveguide band provides negligible error for even very small measurement distances, not exceeding one or two diameters of the measured antenna, depending on the probe type. Since an approximate model was used for the simulations, the obtained results show only preliminary picture and can only be used as tentative guidelines. In this paper, in order to prove the results of the simulations and the derived conclusions, experimental validation of the simplified probe pattern correction was carried out by processing measured results of several electrically large antennas including probe pattern correction at the measured frequency and at the center frequency of the waveguide band, and comparing the difference. The measured results of a center-fed parabolic reflector, an offset reflector, and a base-station antenna were used for the validation. The obtained results generally confirm the simulations and prove the conclusions that just a single probe pattern can be used for all frequencies over a standard waveguide band for majority of spherical near-field measurement scenarios. [1] S. Pivnenko, J.L. Besada, A. Ruiz, C. Rizzo: On the probe pattern correction in spherical near-field antenna measurements. Proc. 37th AMTA Symposium, Long Beach, CA, USA, October 2015 [2] S. Pivnenko, E. Venero, C. Rizzo: Application of single probe correction file for multi-frequency spherical near-field antenna measurements. Proc. 10th EuCAP, Davos, Switzerland, April 2016