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AMTA Paper Archive

Polarization correction of spherical near-field data
J.R. Jones (Scientific-Atlanta, Inc.),D.W. Hess (Scientific-Atlanta, Inc.), November 1984

This paper describes the relationship of probe polarization correction to probe-pattern corrected and non-probe-pattern-corrected spherical near-field measurements. A method for reducing three-antenna polarization data to a form useful for polarization correction is presented. The results of three-antenna measurements and the effects of polarization correction on spherical near-field measurements are presented.

The Determination of near-field correction parameters for circularly polarized probes
A. C. Newell (Electromagnetic Fields Division),D. P. Kremer (Electromagnetic Fields Division), M.H. Francis (Electromagnetic Fields Division), November 1984

In order to accurately determine the far-field of an antenna from near-field measurements the receiving pattern of the probe must be known so that the probe correction can be performed. When the antenna to be tested is circularly polarized, the measurements are more accurate and efficient if circularly polarized probes are used. Further efficiency is obtained if one probe is dual polarized to allow for simultaneous measurements of both components. A procedure used by the National Bureau of Standards for determining the plane-wave receiving parameters of a dual-mode, circularly polarized probe is described herein. First, the on-axis gain of the probe is determined using the three antenna extrapolation technique. Second, the on-axis axial ratios and port-to-port comparison ratios are determined for both the probe and source antenna using a rotating linear horn. Far-field pattern measurements of both amplitude and phase are then made for both the main and cross components. In the computer processing of the data, the on-axis results are used to correct for the non-ideal source antenna polarization, scale the receiving coefficients, and correct for some measurement errors. The plane wave receiving parameters are determined at equally spaced intervals in k-space by interpolation of the corrected pattern data.

The Determination of near-field correction parameters for circularly polarized probes
A. C. Newell (Electromagnetic Fields Division),D. P. Kremer (Electromagnetic Fields Division), M.H. Francis (Electromagnetic Fields Division), November 1984

In order to accurately determine the far-field of an antenna from near-field measurements the receiving pattern of the probe must be known so that the probe correction can be performed. When the antenna to be tested is circularly polarized, the measurements are more accurate and efficient if circularly polarized probes are used. Further efficiency is obtained if one probe is dual polarized to allow for simultaneous measurements of both components. A procedure used by the National Bureau of Standards for determining the plane-wave receiving parameters of a dual-mode, circularly polarized probe is described herein. First, the on-axis gain of the probe is determined using the three antenna extrapolation technique. Second, the on-axis axial ratios and port-to-port comparison ratios are determined for both the probe and source antenna using a rotating linear horn. Far-field pattern measurements of both amplitude and phase are then made for both the main and cross components. In the computer processing of the data, the on-axis results are used to correct for the non-ideal source antenna polarization, scale the receiving coefficients, and correct for some measurement errors. The plane wave receiving parameters are determined at equally spaced intervals in k-space by interpolation of the corrected pattern data.

Planar Near-Field Measurements Using Hexagonal Sampling
L.E. Corey (Georgia Institute of Technology),E. B. Joy (Georgia Institute of Technology), November 1984

This paper describes a new planar near-field measurement technique in which near-field data is collected in a hexagonal rather than a rectangular format. It is shown that the hexagonal method is more efficient than the rectangular technique in that a lower sampling density is required and the hexagonally shaped measurement surface is more compatible with most antenna apertures than the conventional rectangular measurement surface.

Planar Near-Field Measurements Using Hexagonal Sampling
L.E. Corey (Georgia Institute of Technology),E. B. Joy (Georgia Institute of Technology), November 1984

This paper describes a new planar near-field measurement technique in which near-field data is collected in a hexagonal rather than a rectangular format. It is shown that the hexagonal method is more efficient than the rectangular technique in that a lower sampling density is required and the hexagonally shaped measurement surface is more compatible with most antenna apertures than the conventional rectangular measurement surface.

Preliminary development of a phased array near field antenna coupler
D. D. Button (Sanders Associates, Inc.), November 1984

End-to-end testing of electronic warfare (EW) equipment at the organizational or flight lines level is accomplished by use of an antenna coupler which is placed over the EW system antenna. The coupler is used to inject a stimulus signal simulating a signal emanating from a distant radar, and to receive and detect the EW system response (EW transmit) signal. The coupler is used to determine the EW receiver sensitivity over a swept frequency coverage and the EW transmit gain and effective radiated power (ERP) versus frequency characteristics, as well as to determine the operating integrity of the EW antenna and transmission lines.

Preliminary development of a phased array near field antenna coupler
D. D. Button (Sanders Associates, Inc.), November 1984

End-to-end testing of electronic warfare (EW) equipment at the organizational or flight lines level is accomplished by use of an antenna coupler which is placed over the EW system antenna. The coupler is used to inject a stimulus signal simulating a signal emanating from a distant radar, and to receive and detect the EW system response (EW transmit) signal. The coupler is used to determine the EW receiver sensitivity over a swept frequency coverage and the EW transmit gain and effective radiated power (ERP) versus frequency characteristics, as well as to determine the operating integrity of the EW antenna and transmission lines.

Broad band feeds for new RCS ranges
K.S. Kelleher, November 1984

Recent construction of RCS ranges has involved paraboloidal reflectors ranging from a few feet to sixty feet in diameter. These reflectors have required broad band feeds because the typical radar illuminator-receiver is capable of operating over an octave in frequency. This paper will describe a series of feeds which cover any octave in frequency from 100 mHz to 8 gHz, with coaxial line inputs. In addition waveguide-port feeds will be described which cover all of the standard waveguide bands up to 18 gHz. The four basic requirements for all of these feeds are: a) capable of handling the radar power, b) VSWR less than 2 to 1, c) orthomode operation with a 30 db isolation between the two linear polarizations and d) a radiation pattern which is constant with frequency. A fifth problem, for the reflectors which are truncated, is that of providing an elliptical cross section beam over the frequency band.

Broad band feeds for new RCS ranges
K.S. Kelleher, November 1984

Recent construction of RCS ranges has involved paraboloidal reflectors ranging from a few feet to sixty feet in diameter. These reflectors have required broad band feeds because the typical radar illuminator-receiver is capable of operating over an octave in frequency. This paper will describe a series of feeds which cover any octave in frequency from 100 mHz to 8 gHz, with coaxial line inputs. In addition waveguide-port feeds will be described which cover all of the standard waveguide bands up to 18 gHz. The four basic requirements for all of these feeds are: a) capable of handling the radar power, b) VSWR less than 2 to 1, c) orthomode operation with a 30 db isolation between the two linear polarizations and d) a radiation pattern which is constant with frequency. A fifth problem, for the reflectors which are truncated, is that of providing an elliptical cross section beam over the frequency band.

Effects of the alignment errors on ahorn's crosspolar pattern measurements. Application to L-SAT propagation package antennas.
M. Calvo (Universidad Potitecnica de Madrid),J.L. Besada (Universidad Potitecnica de Madrid), November 1984

When low crosspolar pattern measurements are required, as in the case of the L-SAT Propagation Package Antennas (PPA) with less than -36 dB linear crosspolarization inside the coverage zone, the use of good polarization standards is mandatory (1). Those are usually electroformed pyramidal horns that produce crosspolar levels over the test zone well below the -60 dB level typically produced by the reflectivity of anechoic chambers. In this case the alignment errors (elevation, azimuth and roll as shown in fig. 1) can become important and its efects on measured patterns need to be well understood.

Effects of the alignment errors on ahorn's crosspolar pattern measurements. Application to L-SAT propagation package antennas.
M. Calvo (Universidad Potitecnica de Madrid),J.L. Besada (Universidad Potitecnica de Madrid), November 1984

When low crosspolar pattern measurements are required, as in the case of the L-SAT Propagation Package Antennas (PPA) with less than -36 dB linear crosspolarization inside the coverage zone, the use of good polarization standards is mandatory (1). Those are usually electroformed pyramidal horns that produce crosspolar levels over the test zone well below the -60 dB level typically produced by the reflectivity of anechoic chambers. In this case the alignment errors (elevation, azimuth and roll as shown in fig. 1) can become important and its efects on measured patterns need to be well understood.

A Dual shaped compact range for EHF antenna measurements
J.K. Conn (Harris Corporation),C. L. Armstrong (Harris Corporation), L. S. Gans (Harris Corporation), November 1984

A dual offset shaped reflector compact range is described. Improvements over the traditional single reflector, apex-fed compact range are outlined and discussed. A design plan for a dual offset shaped reflector compact range for EHF antenna measurement is presented.

A Dual shaped compact range for EHF antenna measurements
J.K. Conn (Harris Corporation),C. L. Armstrong (Harris Corporation), L. S. Gans (Harris Corporation), November 1984

A dual offset shaped reflector compact range is described. Improvements over the traditional single reflector, apex-fed compact range are outlined and discussed. A design plan for a dual offset shaped reflector compact range for EHF antenna measurement is presented.

Ultra low sidelobe testing by planar near field scanning
K. R. Grimm (Technology Service Corporation), November 1984

An innovative technique has been developed for accurately measuring very low Sidelobe Antenna patterns by the method of planar near field probing. The technique relies on a new probe design which has a pattern null in the direction of the test antenna’s steered bean direction. Simulations of the near field measurement process using such a probe show that -60dB peak side-lobes will be accurately measured (within established bounds) when the calibrated near field dynamic range does not exceed 40 dB. The desireable property of the new probe is its ability to “spatially filter” the test antenna’s spectrum by reduced sensitivity to main beam ray paths. In this way, measurement errors which usually increase with decreasing near field signal level are minimized. The new probe is also theorized to have improved immunity to probe/array multipath and to probe-positioning errors. Plans to use the new probe on a modified planar scanner during tests with the AWACS array at the National Bureau of Standards will be outlined.

Ultra low sidelobe testing by planar near field scanning
K. R. Grimm (Technology Service Corporation), November 1984

An innovative technique has been developed for accurately measuring very low Sidelobe Antenna patterns by the method of planar near field probing. The technique relies on a new probe design which has a pattern null in the direction of the test antenna’s steered bean direction. Simulations of the near field measurement process using such a probe show that -60dB peak side-lobes will be accurately measured (within established bounds) when the calibrated near field dynamic range does not exceed 40 dB. The desireable property of the new probe is its ability to “spatially filter” the test antenna’s spectrum by reduced sensitivity to main beam ray paths. In this way, measurement errors which usually increase with decreasing near field signal level are minimized. The new probe is also theorized to have improved immunity to probe/array multipath and to probe-positioning errors. Plans to use the new probe on a modified planar scanner during tests with the AWACS array at the National Bureau of Standards will be outlined.

Cylindrical near field test facility for UHF Television Transmitting Antennas
J.A. Donovan (Harris Corporation),E.B. Joy (Georgia Institute of Technology), November 1984

This paper describes a horizontal, cylindrical surface, near-field measurement facility which was designed and constructed in 1984 and is used for the determination of far field patterns from near field measurement of UHF television transmitting antennas. The facility is also used in antenna production as a diagnostic and alignment tool.

Cylindrical near field test facility for UHF Television Transmitting Antennas
J.A. Donovan (Harris Corporation),E.B. Joy (Georgia Institute of Technology), November 1984

This paper describes a horizontal, cylindrical surface, near-field measurement facility which was designed and constructed in 1984 and is used for the determination of far field patterns from near field measurement of UHF television transmitting antennas. The facility is also used in antenna production as a diagnostic and alignment tool.

Characteristics and Capabilities of the Lewis Research Center high precision 6.7- by 6.7-M planar near-field scanner
G.R. Sharp (NASA),C.A. Raquet (NASA), R.E. Alexovich (NASA), R.J. Zakrajsek (NASA), R.R Kunath (NASA), November 1984

The development of advanced spacecraft communication antenna systems is an essential part of NASA’s satellite communications base research and technology program. The direction of future antenna technology will be toward antennas which are large, both physically and electrically; which will operate at frequencies of 60 GHz and above; and which are nonreciprocal and complex, implementing multiple beam and scanning beam concepts that use monolithic semiconductor device technology. The acquisition of accurate antenna performance measurements is a critical part of the advanced antenna research program and represents a substantial antenna measurement technology challenge, considering the special characteristics of future spacecraft communications antennas.

Characteristics and Capabilities of the Lewis Research Center high precision 6.7- by 6.7-M planar near-field scanner
G.R. Sharp (NASA),C.A. Raquet (NASA), R.E. Alexovich (NASA), R.J. Zakrajsek (NASA), R.R Kunath (NASA), November 1984

The development of advanced spacecraft communication antenna systems is an essential part of NASA’s satellite communications base research and technology program. The direction of future antenna technology will be toward antennas which are large, both physically and electrically; which will operate at frequencies of 60 GHz and above; and which are nonreciprocal and complex, implementing multiple beam and scanning beam concepts that use monolithic semiconductor device technology. The acquisition of accurate antenna performance measurements is a critical part of the advanced antenna research program and represents a substantial antenna measurement technology challenge, considering the special characteristics of future spacecraft communications antennas.

Structural Design of a vertical antenna boresight 18.3- by 18.3-M planar near-field antenna measurement system
G. R. Sharp (NASA),P. A. Trimarchi (NASA) J.S. Wanhainen (NASA), November 1984

The near-field antenna testing technique is now an established testing approach. It is based on the work done over a twenty-year period by the National Bureau of Standards (Boulder, Colorado), The Georgia Institute of Technology and others. The near-field technique is used for large aperture, high frequency antennas where the antenna to probe separation necessary to test in the far-field of the antenna is prohibitively large.







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