Jin-Seob Kang,Jeong-Hwan Kim, November 2020
Electrical material parameters such as permittivity and permeability are a prerequisite to analysis and to design of EM devices and systems.For the measurements of the EM material parameters, coaxial/waveguide methods and cavity method are used in low frequency range whereas free-space method is suitable in high frequency range. In free-space method, one of the non-destructive methods without prior machining of a MUT (Material Under Test), TRL (Thru-Reflect-Line) calibration method is used when the free-space measurement system has a linear slide to precisely adjust the separation distance between transmit (Tx) and receive (Rx) antennas, and GRL (Gated-Reflect-Line) calibration method in the case that the separation distance between the two antennas is fixed.
As one of the well-known calibration methods, SOLR (Short-Open-Load-Reciprocal) calibration method assumes seven unknowns in the free-space material measurement configuration, i.e., the port-#1-side directivity, match, and tracking (E_DF, E_SF, E_RF) between the VNA test port #1 and the MUT, the port-#2-side directivity, match, and tracking (E_DR, E_SR, E_RR) between the VNA test port #2 and the MUT, and the quotient ?/…. This calibration, first performs two one-port calibrations at the port-#1-side and port-#2-side to determine (E_DF, E_SF, E_RF) and (E_DR, E_SR, E_RR) using three reflection standards, and then performs one transmission measurement using a reciprocal two-port standard (in this case, thru) for determining ?/….
Calibration of a free-space material measurement system by using SOLR method requires three free-space reflection standards. Recently, a planar offset short is proposed as a free-space reflection standard because its reflection property has the magnitude of unity and the phase proportional to the offset of the offset short. This paper proposes the SOLR method using three planar offset shorts with the respective offset of (0, ?/6, 2?/6) for calibrating a free-space measurement system. Effects due to the thickness of the MUT are compensated by a de-embedding process. The thinner the thickness is, the better results this method can get. The proposed method does not require a linear slide to precisely adjust the separation distance between Tx and Rx antennas of the measurement system. Theoretical details and measurement results will be presented at the symposium.