Welcome to the AMTA paper archive. Select a category, publication date or search by author.
(Note: Papers will always be listed by categories. To see ALL of the papers meeting your search criteria select the "AMTA Paper Archive" category after performing your search.)
The remote capability of the ORBIT AL-8000-5 Microwave Receiver is described. The use of a high speed fiber optic link between the remote receiver and the control room unit allows range distances of up to 19,000 feet. With repeaters, the range distance limitation is removed. This eliminates many of the distance cable and EMI problems associated with receivers which use a remote LO. The small size and weight of the remote unit, allow the system to be mounted on the probe carriage of near-field scanner systems. This eliminates the high frequency phase errors as well as the phase error due to cable bending and temperature variation during the measurement. The result is a lower cost and more accurate measurement system. The advantages of this type of remote system are discussed for both near-field and far-field applications. Measurement data which show the performance of the fiber-optic system are presented. A description and pictures of recent installations are to be provided.
Implementation of planar near-field (PNF) technology has become more practical in recent years due to the availability of turn-key measurement systems. McClellan AFT (SM-ALC) has developed an automated PNF measurement system by re-configuring a sonar immersion tank positioner. Modifications to the hardware and software have produced an integrated PNF scanner capable of accurate gain and diagnostic measurements. This paper describes the evolution of the SM-ALC near-field measurement system from proof-of-concept diagnostic scanner to a production tool capable of repeatable gain measurements. Analysis of accuracies, limitations, and processing capabilities is provided. Comparative analysis of data for a transfer standard antenna measured on the SM-ALC measurement system and the PNF measurement system at the National Institute of Standards and Technology is also included.
The radiation patterns of a low (40dB) sidelobe antenna have been measured on a variety of antenna test ranges including Near Field, Far Field and Compact versions. Originally intended to validate new Near Field Ranges, some of the early results will be presented and the variations examined. The need for some form of range validation is shown. There is also some explanation of the fundamental effects that various ranges have on results.
This paper will show that it is possible to make bistatic measurements in a compact range environments using near field scanning. A test scanner is designed and operated. Criteria for the accuracy of positioning and repositioning are presented. Algorithms for the transformation of the raw data into bistatic far field calibrated RCS are presented. Examples will be presented where comparisons with theoretical bistatic sphere data are shown. Bistatc pedestal interaction terms will be demonstrated.
Edge and corner diffraction and non-planewave illumination both cause measured free space relativity data to deviate from the infinite sample/planewave result which is predicted when using the Transmission Line Methos (TLM) for planar surfaces. The amount by which each of the two factors perturbs the measured data depends on the measurement system used; compact ranges, near field focused antennas and far field antennas on an NRL arch are all susceptible to the effects of non-planewave illumination and perimeter diffraction. Perimeter diffraction is virtually eliminated in the case of a near field focused system or where the sample is semi-infinite; however, the truncated illumination inevitable yields additional angular planewave components. In a far field system, the quadratic phase variation at the sample surface is shown to cause significant errors in the depth of resonant nulls. A uniform illumination is required to accurately map the depth of resonant nulls, but the consequent perimeter diffraction causes errors in null position. Perimeter diffraction does not cause errors in the null depth providing the illumination in uniform.
Compact range systems have been widely used for antenna measurements. However, the amplitude taper can lead to significant measurement errors especially as the dimension of antenna is larger than quiet zone area. An amplitude taper removing technique by software implement is presented for compact range system. A 12 feet by 1.0 feet S-band rectangular slot array antenna is measured in SA5751 compact range system, which provides a quiet zone area with a 4 feet diameter. Results of corrected far-field patterns from compact range are compared with that taken by planar near-field range.
The experience with near-field scanning at Scientific-Atlanta began with a system based upon a analog computer for computing the two-dimensional Fourier transform of the main polarization component. When coupled with a phase/amplitude receiver and a modest planar near-field scanner this system could produce far-field patterns from near-field scanning measurements. In the 1970’s it came to be recognized that the same advances, which made the more sophisticated probe-corrected planar near field measurements possible, would enable conventional far-field range hardware to be used on near-field ranges employing spherical coordinates. In 1980 Scientific-Atlanta first introduced a spherical near-field scanning system based upon a minicomputer already used to automate data acquisition and display. In 1990, to meet the need of measuring complex multistate phased-array antennas, Scientific Atlanta began planning a system to support the high volume data requirement and high speed measurement need represented by this challenge. Today Scientific-Atlanta is again pursuing planar near-field scanning as the method of choice for this test problem.
The experience with near-field scanning at Scientific-Atlanta began with a system based upon a analog computer for computing the two-dimensional Fourier transform of the main polarization component. When coupled with a phase/amplitude receiver and a modest planar near-field scanner this system could produce far-field patterns from near-field scanning measurements. In the 1970’s it came to be recognized that the same advances, which made the more sophisticated probe-corrected planar near field measurements possible, would enable conventional far-field range hardware to be used on near-field ranges employing spherical coordinates. In 1980 Scientific-Atlanta first introduced a spherical near-field scanning system based upon a minicomputer already used to automate data acquisition and display. In 1990, to meet the need of measuring complex multistate phased-array antennas, Scientific Atlanta began planning a system to support the high volume data requirement and high speed measurement need represented by this challenge. Today Scientific-Atlanta is again pursuing planar near-field scanning as the method of choice for this test problem.
This paper reports on a spherical near-field measurement technique currently being researched at Georgia Tech. Spherical Near-Field Microwave Holography (SNFMH) has been successfully used to locate defects in radome walls. Defects with size greater than or equal to .5 free space wavelengths (?0) in diameter were detected [1]. Present efforts have established theoretical resolution limits for the SNFMH process. The SNFMH technique is used to process spherical near-field measurements of a (.23 ?0 x .12 ?0) open-ended waveguide probe. The probe consists of a section of WR92 waveguide, tapered down to one fourth of its standard dimensions. The results are compared to the theoretical mode-limited impulse response. The SNFMH technique is also used to process spherical near-field measurements of a plastic, 8 ?0 radius, hemisphere radome with various plastic defects attached. Results of a case with two .5 ?0 diameter plastic defects are compared to the theoretical mode-limited pulse response. Contour plots of uniquely shaped defects are shown.
Probe correction is necessary in near-field measurements to compensate for non-ideal probes. Probe compensation requires that the probe’s far-field pattern be known. In many cases direct far-field measurements are undesirable, wither because they require dismantling the probe from te near-field range set-up or because a far-field range is not available. This paper presents a unique methos of deriving probe-correction coefficients by measuring a probe on a near-field range with an “identical” probe and taking the square root of the transformed far field. This technique, known as the “robe-square-root” method can be thought of as self-compensation. Far-field comparisons are given to show that this technique is accurate.
Portable near-field measurement systems can provide significant flexibility to both large companies seeking to increase their antenna test capabilities, and small companies looking for their first investment in a test range. There are many unique applications for portable near-field antenna measurement systems in addition to their use for standard antenna performance measurements. Some additional applications include flight-line testing, anechoic chamber quiet zone imaging, and EMI testing. Many of NSI’s near-field systems have been portable designs, capable of being set up in a small lab or office and easily relocated. Key features required for use of a portable system are rapid setup, simplicity of use, low cost, and accuracy. This paper will be focused on practical experience with installing, calibrating, and operating portable near-field measurement systems. It will also cover tradeoffs in their design, and usage in a variety of applications.
A recently developed analytic technique that can correct for probe position errors in planar near-field measurements to arbitrary accuracy [1] is shown to be also applicable to spherical near-field data after appropriate modifications. The method has been used to successfully remove errors in the near-field, hence leading to more accurate far-field patterns, even if the maximum error in the probe’s position is as large as 0.2?. Only the error-contaminated near-field measurements and an accurate probe position error function are needed to be able to implement the correction technique. It is assumed that the probe position error function is a characteristic of the near-field range, and that it has been obtained using state-of-the-art laser positioning and precision optical systems. The method also requires the ability to obtain derivatives of the error contaminated near-field defined on an error-free regular grid with respect to the coordinates. In planar geometry the derivatives are obtained using FFTs [1], and, in spherical geometry, one needs to compute derivatives of Hankel functions for radical errors, and derivatives of the spherical electric and magnetic vector basis functions for errors in the ? and Ø coordinates. The error-correction technique has been shown to work well for errors in and of the spherical coordinates r, ? or Ø. Efficient computer codes have been developed to demonstrate the technique using computer simulations.
This paper describes measurement system performance parameters that were considered during the design phase of a planar near-field measurement range for Spar Aerospace Limited. All aspects of the planar near-field measurement system are addressed. These include; instrument selection, scanner interface hardware, system controller/computer hardware, software for data collection, near-field to far-field transformation, data analysis, networking and system configuration. The Scientific-Atlanta Model 2095 Microwave Measurement System with its near-field options is used as the basis for meeting the Spar requirement. The various data collection parameters of the Model 2095 are described with special emphasis on how the factors relate to near-field requirements such as fixed grid sampling. Examples of typical test scenarios are presented as an aid in exploring detailed data collection system timing.
This paper describes measurement system performance parameters that were considered during the design phase of a planar near-field measurement range for Spar Aerospace Limited. All aspects of the planar near-field measurement system are addressed. These include; instrument selection, scanner interface hardware, system controller/computer hardware, software for data collection, near-field to far-field transformation, data analysis, networking and system configuration. The Scientific-Atlanta Model 2095 Microwave Measurement System with its near-field options is used as the basis for meeting the Spar requirement. The various data collection parameters of the Model 2095 are described with special emphasis on how the factors relate to near-field requirements such as fixed grid sampling. Examples of typical test scenarios are presented as an aid in exploring detailed data collection system timing.
A novel bi-polar planar near-field measurement range is described. This range is mechanically simple and has a reduced implementation cost compared to other planar techniques. The particular physical implementation and comparison with the plane-polar range is presented. Development aspects of the customized bi-polar range at UCLA are summarized. An optimal near-field interpolation is used to enable the near-field to far-field (NF-FF) processing via fast Fourier transform (FFT). Computer simulated near-field and far-field results are given.
Far-field pattern prediction of a mm wave reflector antenna from a scan of the near-field modulus is reported. The phase retrieval algorithm utilises minimisation and the generalized error reduction algorithm to retrieve both aperture amplitude and phase from a single planar intensity scan. The far-field pattern is calculated from the retrieved complex aperture. Experimental results from measurement of a 1.12m diameter reflector at 32 GHz are presented to illustrate the practicality of the algorithm for millimeter and submillimeter applications.
The Antenna Metrology Group of the National Institute of Standards and Technology (NIST) has recently developed and implemented measurement procedures to diagnose faults on a flat phased-array antenna. First, the antenna was measured on the NISTplanar near-field (PNF) range, taking measurements on a plane where the multiple reflections between the probe and the antenna under test are minimized. This is important since the PNF method does not directly allow for these reflections. Then, the NIST PNF software which incorporates the fast Fourier transform (FFT) was used to determine the antenna’s gain and pattern and to evaluate the antenna’s performance. Next, the inverse FFT was used to calculate the fields at the aperture lane. By using this technique, errors in the aperture fields due to multiple reflections can be avoided. By analyzing this aperture plane data through the use of detailed amplitude and phase contour plots, faults in the antenna were located and corrected. The PNF theory and utilization of the inverse FFT will briefly be discussed and results shown.
In near field antenna measurements, knowledge of the the [sic] probe antenna’s pattern, polarization and gain are of vital interest. To calibrate a probe for near field measurements is a delicate task, especially if the probe is small, i.e. low gain. The near field probe and the parameters general to a probe calibration are presented. The delicate task of obtaining an accurate gain for small aperture antennas as well as the problem of transfering [sic] the calibration from the facility where the probe is calibrated to the facility where it is to be used are focussed [sic] upon For a small aperture, the pattern is that of the radiating aperture. The unwanted scattering may be removed by filtering in the spherical mode domain thus obtaining the true aperture radiation. The gain derived from this may however be of little use in reality since the aperture always needs some form of mounting. Such a mounting may be covered with absorber which may reflect and diffract and thus affect the gain value.
In this paper, an antenna measurement technique based on modified cylindrical NF/FF transformation will be presented. In conventional cylindrical near-field scanning techniques, the near fields are probed on a cylindrical surface surrounding the test antenna. This required extensive data acquisition and processing time which can be reduced substantially if the antenna under test is illuminated by a cylindrical wave. In this hybrid approach, cylindrical wave illumination is generated using a single parabolic reflector in combination with a (point) source. The far-field pattern is then computed by a powerful one-dimensional NF/FF algorithm. It is concluded that this alternative approach combines the attributes of the compact-range technique and the classical NF/FF transformation.
In this paper, an antenna measurement technique based on modified cylindrical NF/FF transformation will be presented. In conventional cylindrical near-field scanning techniques, the near fields are probed on a cylindrical surface surrounding the test antenna. This required extensive data acquisition and processing time which can be reduced substantially if the antenna under test is illuminated by a cylindrical wave. In this hybrid approach, cylindrical wave illumination is generated using a single parabolic reflector in combination with a (point) source. The far-field pattern is then computed by a powerful one-dimensional NF/FF algorithm. It is concluded that this alternative approach combines the attributes of the compact-range technique and the classical NF/FF transformation.