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Two cylindrical phased array antennas were characterized at the NAVSEA Crane.s Active Array Measurement Test Bed (AAMTB) facility. The antennas include the Full Performance Antenna (FPA) and the Ultra Light Antenna (ULA) that are intended for land mobile test sites for the United States Department of Defense. These air breathing, low-cost antennas are candidates for a new communication system. Crane.s role as the program Technical Advisor (TA) includes integration and performance testing at the component level, antenna level, and system level. This paper discusses issues related to the antenna-testing phase including pattern measurements, G-F, and high power safety concerns. The final goal of the integration and testing phase was to verify that the antenna RF performance specifications were met. To this end, conventional cylindrical near-field pattern testing was adequate for many items such as beam width, pointing angle, and side lobe levels. However, two issues required additional effort: G-F measurement and high-power transmit safety concerns. Since the majority of required measurements could be made using the near-field chamber and the antenna required special controllers and prime power sources, it was desirable to make all measurements in the same location. Hence, a new measurement process was required for G-F using a near-field range and the high-power safety concerns needed to be addressed.
Back projection techniques have been used extensively in planar near-field ranges and to a lesser degree in spherical near-field ranges. Recently a back projection technique allowing back projection from spherical near-field data onto a planar surface has been published and implemented. This paper explores this technique further through the presentation of measured data for a large microstrip array antenna. The results demonstrate how the technique can be used to investigate anomalies in the feed structure of the array.
Z-position errors are generally the largest contributor to the uncertainty in sidelobe levels that are measured on a planar near-field range. The position errors result from imperfections in the mechanical rails that guide the motion of the measurement probe and cause it to deviate from an ideal plane. The deviations ä z (x, y) can be measured with precise optical and/or laser alignment tools and this is generally done during installation and maintenance checks to verify the scanner alignment. If the measurements are made to a very small fraction of a wavelength in Z and at intervals in X and Y approximating one half wavelength, the sidelobe uncertainty can be estimated with high confidence and is usually very small. For Z-error maps with lower resolution the resulting error estimates are generally larger or have lower confidence. This paper describes a method for estimating the Zposition error from a series of planar near-field measurements using the antenna under test. Measurements are made on one or more planes close to the antenna and on other planes a few wavelengths farther away. The Z-distance between the close and far planes should be as large as the probe transport will allow. The difference between the holograms calculated from the close and far measurements gives an estimate of the Z-position errors. This approach has the advantage of using the actual AUT and frequency of interest and does not require specialized measurement equipment.
Z-position errors are generally the largest contributor to the uncertainty in sidelobe levels that are measured on a planar near-field range. The position errors result from imperfections in the mechanical rails that guide the motion of the measurement probe and cause it to deviate from an ideal plane. The deviations ä z (x, y) can be measured with precise optical and/or laser alignment tools and this is generally done during installation and maintenance checks to verify the scanner alignment. If the measurements are made to a very small fraction of a wavelength in Z and at intervals in X and Y approximating one half wavelength, the sidelobe uncertainty can be estimated with high confidence and is usually very small. For Z-error maps with lower resolution the resulting error estimates are generally larger or have lower confidence. This paper describes a method for estimating the Zposition error from a series of planar near-field measurements using the antenna under test. Measurements are made on one or more planes close to the antenna and on other planes a few wavelengths farther away. The Z-distance between the close and far planes should be as large as the probe transport will allow. The difference between the holograms calculated from the close and far measurements gives an estimate of the Z-position errors. This approach has the advantage of using the actual AUT and frequency of interest and does not require specialized measurement equipment.
We have measured the amplitude and the phase of the electric field on a planar area very near (about 0.3 wavelengths) to the aperture of a X-band standard gain horn antenna using a photonic sensor and transformed the aperture field distribution to the far field pattern. The measured aperture field distributions and antenna patterns agreed well with those calculated by the method of moments. Comparing the far field patterns by the photonic sensor and the conventional open-ended rectangular waveguide probe reveals that the antenna measurement using the photonic sensor has advantages over the conventional probe.
High precision near field measurement systems in dual polarization have stringent requirements on the probe performance in terms of radiation pattern shape, on-axis and off-axis polarization purity and port-to-port isolation. In general, these specific requirements can be fulfilled using single polarized probes for narrow frequency bands (about 10% relative bandwidth) and using mechanical rotation for polarization diversity. Consequently, several sealed probes and complicated procedures are necessary to cover the operational frequency band of most common antenna applications leading to inefficient and time-consuming measurement procedures. SATIMO has developed high precision wide-band, dual polarized near field probes covering the frequency range from L to Ka-band to overcome this problem. Two different probe technologies have been applied, each particularly well suited for the appropriate low (L to X-band) and high (X to Ka-band) frequency range. The low frequency probe design is based on a compact corrugated horn with capacitive orthogonal excitations. The high frequency probe design consists of an axially symmetric corrugated horn, a square to circular wave-guide transition, and a wide-band, high isolation ortho-mode junction (OMJ) exciting the orthogonal polarizations. Probes in C-band and Ku-band have been delivered to and tested by ALCATEL SPACE INDUSTRIES in their planar near field antenna test range in Toulouse. The C-band probes have operational bandwidths of 25% covering the entire commonly used transmit and receive frequency bands for C-band communication satellites. The Ku-band probes have operational bandwidths of 40% covering the entire commonly used transmit and receive frequency bands for Ku-band communication satellites.
A passive intermodulation (PIM) near-field XY-scanner for the GSM900 frequency band has been earlier constructed to localize distortion sources in antennas and in other open structures. However, the measured intermodulation level has been relatively high, around 90 dBm. The equipment should be able to measure distortion levels down to 115 dBm with an input power of 2x20W, since the noise floor of a GSM900 base station is typically around 110 dBm. The sensitivity is limited either by thermal noise or by residual intermodulation distortion depending on the sensor coupling. Various causes of residual intermodulation distortion in the PIM near-field measurement are considered and evaluated. Sensitivity measurements of the scanner have been carried out on two test devices. With a sensor coupling of 30 dB, sensitivities of 115 dBm and 105 dBm have been achieved with an electric and a magnetic field sensor, respectively.
A passive intermodulation (PIM) near-field XY-scanner for the GSM900 frequency band has been earlier constructed to localize distortion sources in antennas and in other open structures. However, the measured intermodulation level has been relatively high, around 90 dBm. The equipment should be able to measure distortion levels down to 115 dBm with an input power of 2x20W, since the noise floor of a GSM900 base station is typically around 110 dBm. The sensitivity is limited either by thermal noise or by residual intermodulation distortion depending on the sensor coupling. Various causes of residual intermodulation distortion in the PIM near-field measurement are considered and evaluated. Sensitivity measurements of the scanner have been carried out on two test devices. With a sensor coupling of 30 dB, sensitivities of 115 dBm and 105 dBm have been achieved with an electric and a magnetic field sensor, respectively.
A Ground-Based Synthetic Aperture Radar (GB-SAR) interferometer system operating at 17 GHz is used to monitor the movement of an active landslide. The selection of the optimal image formation technique for such an imaging system is addressed. The algorithms considered in this study are those previously developed for spaceborne and airborne SAR. A near-field algorithm that forms the image in the time domain is selected as the optimal solution. Furthermore, example results obtained in a measurement campaign in Schawz (Austria) are shown.
Choosing the proper antenna range configuration is important in making accurate measurements and verifying antenna performance. This paper will describe the steps involved so the antenna engineer can select and specify the best antenna range configuration for a given antenna. It will describe the factors involved in choosing between near-field systems versus far-field systems, and the different scan types involved. It will explain the advantages of each type of antenna range and how the choices are affected by such factors as aperture size, frequency range, gain, beamwidth, polarization, field of view, sidelobe levels, and backlobe characterization desires. This paper will help the antenna engineer identify, understand, and evaluate the applicable characteristics and will help him in specifying the proper antenna range for testing the antenna.
The radiation properties of an antenna are defined in the far field, since this is the environment that they will operate. Creating far field conditions when testing a large aperture antenna is quite challenging. This is particularly true if testing occurs within the confines of an anechoic chamber, or if other complicating field characteristics (like angle-of-arrival simulation) are desired. Rather than attempt to generate a true planewave in the usual manner, we propose an instrument that creates a field distribution in the near field of a transmit array that is planewave-like in nature only over specified regions of interest (a region occupied by an antenna under test, for example); we do not require that the incident field be a true planewave at other locations. In these other locations the field is free to assume any value demanded by the governing equations of electromagnetics. By relaxing the requirement on the electromagnetic field in the test volume, we considerably reduce the complexity of the problem and define a tractable problem with a potential engineering solution.
The Antenna Branch of NAVSEA Crane was tasked to design and formulate a plan to pattern test a CWI Illuminator antenna in line of sight with a SATCOM antenna. The Navy has problems finding new places aboard ship to mount antennas without having interaction between them. The separation would be about 19 feet, within the near field zone of the Illuminator. The testing was performed on a 2000 foot outdoor range. A special test fixture was designed by Crane Engineering to mount both the Illuminator and the SATCOM to their proposed mounting locations. The unique characteristic of this measurement approach is the mounting of both the FCS antenna and the SATCOM antenna and radome on a test fixture, which allows complete pattern measurements with different antenna orientations relative to each other. A limited raster scan was used for collecting the data in a 3-D result. Baseline data files were collected without the SATCOM present for comparisons. A Matlab program written to evaluate the results. The proposed mounting location produced unacceptable results in the radiating pattern of the Illuminator antenna. Crane Engineering calculated a new mounting location from the results of the data taken in the Raster scan. Subsequent testing was done and proved to be a valid location for the Illuminators test requirements.
With the continued growth of mobile communications and the emergence of wireless LAN and personal area networks (PAN), there is an increased need to accurately measure the antenna properties for omnidirectional antennas and antenna systems. Furthermore, it is very desirable that antenna measurement systems be flexible to support a variety of antenna configurations and form factors. In this paper, we assess the performance of two measurement configurations utilizing dielectric positioners. These configurations comprise a traditional roll-over-azimuth antenna positioner and an arm-overturntable system such as that used in ORBIT/FR’s Advanced Spherical Cellular Near-Field (ASCENT) product. The results show that both configurations offer demonstrable improvements over conventional metallic positioners, and the arm-based system provides the highest accuracy for omnidirectional antennas.
This paper presents a 'mid-range' calibration technique, now being developed for a 60 ft. diameter reflector site. With this technique, near-field amplitude and phase is collected at a calibration tower as the reflector scans across it. The mid-range 'near-field' data is then transformed to a far-field pattern using a Fourier transform technique. Information on far-field EIRP, directivity, pointing, axial ratio and tilt, as well as encoder timing is obtained with accuracies comparable to standard measurement techniques. A particular advantage is that the system, once set-up, can be used on a regular basis without impacting site operations.
This paper presents a 'mid-range' calibration technique, now being developed for a 60 ft. diameter reflector site. With this technique, near-field amplitude and phase is collected at a calibration tower as the reflector scans across it. The mid-range 'near-field' data is then transformed to a far-field pattern using a Fourier transform technique. Information on far-field EIRP, directivity, pointing, axial ratio and tilt, as well as encoder timing is obtained with accuracies comparable to standard measurement techniques. A particular advantage is that the system, once set-up, can be used on a regular basis without impacting site operations.
As part of an ESA/ESOC development project [1] a set of three planar Ka band Frequency Selective Surface (FSS) mirrors were designed. For design verification purposes a set of FSS samples of sufficient size (about 220mm by 250mm) to demonstrate their design was manufactured. The RF performance of these samples was measured on a planar near field scanner at ERA Technology and on a compact antenna test range (CATR) at ESA/ESTEC for test comparison purposes. The FSS were designed to operate over a narrow range of RF incidence angles (30º + 1º). Hence, it was important for test purposes that the FSS samples be illuminated by a near plane wave. This was achieved with a 220mm offset reflector. As the FSS samples were relatively small it was also desirable that any edge effects should not significantly influence the measurement. Hence, the test reflector antenna was designed to operate with a tapered RF distribution of –20 dB at its edges. A precision framework was constructed to hold the FSS samples at the required incidence angle. The two methods of measurement show remarkable agreement and indicate that the differential pass-band phase and amplitude performance of the FSS samples can be measured to within approximately 1 degree of phase and about 0.03 dB of amplitude
The need for a well-defined accuracy estimate in antenna measurements requires identification of all possible sources of inaccuracy and determination of their influence on the measured parameters. For anechoic chambers, one important source of inaccuracy is the reflection from the absorbers on walls, ceiling, and floor, which gives rise to so-called stray signals that interfere with the desired signal. These stray signals are usually quantified in terms of the reflectivity level. For near-field measurements, the reflectivity level is not sufficient information for estimation of inaccuracy due to the stray signals since the near-to-far-field transformation of the measured near-field may essentially change their influence. Moreover, the inaccuracies are very different for antennas of different directivity and with different level of sidelobes, and for different parts of the radiation pattern. In this paper, the simulation results of a spherical near-field antenna measurement in an anechoic chamber are presented and discussed. The influence of the stray signals on the directivity at all levels of the radiation pattern is investigated for several levels of the chamber reflectivity and for different antennas. The antennas are modeled by two-dimensional arrays of Huygens' sources that allow calculation of both the exact near-field and the exact far-field. The near-field with added stray signals is then transformed to the far-field and compared to the exact far-field. The copolar and cross-polar directivity patterns are compared at different levels down from the peak directivity.
The need for a well-defined accuracy estimate in antenna measurements requires identification of all possible sources of inaccuracy and determination of their influence on the measured parameters. For anechoic chambers, one important source of inaccuracy is the reflection from the absorbers on walls, ceiling, and floor, which gives rise to so-called stray signals that interfere with the desired signal. These stray signals are usually quantified in terms of the reflectivity level. For near-field measurements, the reflectivity level is not sufficient information for estimation of inaccuracy due to the stray signals since the near-to-far-field transformation of the measured near-field may essentially change their influence. Moreover, the inaccuracies are very different for antennas of different directivity and with different level of sidelobes, and for different parts of the radiation pattern. In this paper, the simulation results of a spherical near-field antenna measurement in an anechoic chamber are presented and discussed. The influence of the stray signals on the directivity at all levels of the radiation pattern is investigated for several levels of the chamber reflectivity and for different antennas. The antennas are modeled by two-dimensional arrays of Huygens' sources that allow calculation of both the exact near-field and the exact far-field. The near-field with added stray signals is then transformed to the far-field and compared to the exact far-field. The copolar and cross-polar directivity patterns are compared at different levels down from the peak directivity.
In a conventional manner, a majority of compact ranges are currently used between 2 GHz and 200 GHz. Mechanical stiffness limits compact ranges at high frequency and diffraction effects are dominant at low frequency. However, CNES has installed a single reflector with dedicated serrations to perform accurate measurements between 800 MHz and 2 GHz. These serrations are 2 meters long and minimize the ripple in both amplitude and phase within the quiet zone. In order to further improve its measurement capabilities at lower frequencies, CNES has installed, in co-operation with SATIMO, a spherical near field measurement system directly inside of its compact range building. The goal is to measure antennas within the frequency range 80 MHz – 400 MHz with a relatively good accuracy. The spherical near field measurement facility has been tested and validated with four antennas that had been previously measured in the compact range of CNES and other external ranges. This paper focuses in this smart approach, which allows to extend the lower frequency domain of compact ranges. This paper describes in details the measurement facility, the test and the validation of the system.
We at MI Technologies have employed the Hansen error analysis [1] developed at the Technical University of Denmark (TUD), as a starting point for new system layouts. Here I expand it in two ways: the approach to mechanical errors, and the approach to system design. I offer an alternative approach to the analysis of mechanical uncertainties. This alternative approach is based upon an earlier treatment of spherical coordinate positioning analysis for far-field ranges [2]. The result is an appropriate extension of the TUD uncertainty analysis. Also, the TUD error analysis restricts its attention to three categories of errors: mechanical inaccuracies and receiver inaccuracies and truncation effects. An error analysis for a spherical measurement system should desirably contain entries equivalent to the 18-term NIST table for planar near-field [5]. In this paper, I offer such an extended tabulation for spherical measurements.