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Polarization

The Calibration of probes for near field measurements
J. Lemanczyk (Technical University of Denmark),F. Jensen (TICRA Consultants), November 1991

In near field antenna measurements, knowledge of the the [sic] probe antenna’s pattern, polarization and gain are of vital interest. To calibrate a probe for near field measurements is a delicate task, especially if the probe is small, i.e. low gain. The near field probe and the parameters general to a probe calibration are presented. The delicate task of obtaining an accurate gain for small aperture antennas as well as the problem of transfering [sic] the calibration from the facility where the probe is calibrated to the facility where it is to be used are focussed [sic] upon For a small aperture, the pattern is that of the radiating aperture. The unwanted scattering may be removed by filtering in the spherical mode domain thus obtaining the true aperture radiation. The gain derived from this may however be of little use in reality since the aperture always needs some form of mounting. Such a mounting may be covered with absorber which may reflect and diffract and thus affect the gain value.

Application of RCS antenna measurements to multiport antennas
E. Heidrich (Institut fur Hochstfrequenztechnik und Elektronik),W. Wiesbeck (Institut fur Hochstfrequenztechnik und Elektronik), November 1991

New results of wideband polarimetric radar-cross-section-(RCS-) antenna measurements are presented. A special antenna network description including polarization information and multiport feeding offers new insight in antenna behavior. The procedure omits the utilization of a standard gain antenna for absolute gain determination and no RF-feedline is necessary to the antenna under test. Antenna radiation, scattering and feed characteristics are all obtained with one measurement setup. Theory as well as measurements on different dual-polarized antenna types demonstrate the efficiency and uniqueness of this technique.

Spherical probing demonstrated on a far-field range
R.E. Wilson (Georgia Institute of Technology),D.N. Black (Georgia Institute of Technology), E.B. Joy (Georgia Institute of Technology), G. Edar (Georgia Institute of Technology), M.G. Guler (Georgia Institute of Technology), November 1991

The spherical probing technique for the angular location of secondary scatterers in antenna measurement ranges is demonstrated for an anechoic chamber far-field range. Techniques currently used for source location use measurements of the range field on a line or plane. A linear motion unit and possible a polarization rotator are necessary to measure the range field in this manner. The spherical range probing technique uses measurements of the range field over a spherical surface enclosing the test zone allowing existing range positioners to be used for the range field measurement. The spherical probing technique is demonstrated on an anechoic chamber far-field range with a known secondary reflection source. The plane wave spectrum of the measured range field is computed and used for source angular location. Source locations in the range correspond to the angular locations of amplitude peaks in the spectrum. The effects of the range field probe on this spherical probing is investigated by performing probe compensation.

A New concept for UHF/L-Band compact range antenna feeds
R. Henderson (GE-Astrospace Division),M. Yaffe (GE-Astrospace Division), November 1990

A new approach has been developed to achieve an octave bandwidth, reduced size feed fot compact range reflectors. It can provide highly isolate, orthogonal polarizations with a minimal size, suitable for operation at frequencies down to 500 MHz and below. Its construction is relatively simple, with only a few specific dimensions. The beam-width is compatible with compact range reflector feed requirements. The method uses crossed dipoles over a small circular ground plane, with a rim to equalize the E- and H- plane patterns. Parasitic elements are employed to extend the bandwidth with matching provided via a section built into the feed line. The design was optimized using the Numerical Electromagnetics Code (NEC) computer program.

Productivity improvements for a gated-CW radar
J.B. Wilson (Scientific-Atlanta, Inc.), November 1990

This paper will describe new developments in a gated-CW radar that has been designed to improve the productivity and sensitivity of RCS measurements. Improvements in data acquisition speeds result from the design of a fast synthesizer, a data acquisition co-processor and a pulse modulator. Each of these new products have been specifically designed to take advantage of the high speed capabilities of Scientific-Atlanta’s Model 1795 Microwave Receiver. The RF sub-system has also been designed to permit continuous 2-18 GHz, full polarization data acquisitions. Critical RF components are now mounted at the feed in the chamber, improving the sensitivity and ringdown of the system. Productivity in analysis activities has been improved by the use of a multi-tasking system controller which permits simultaneous use of the system for acquisitions, analysis and plotting.

GO taper and cross-polarization error corrections for RCS measurements in compact range
J-R. Gau (The Ohio State University),T-H. Lee (The Ohio State University), W.D. Burnside (The Ohio State University), November 1990

Compact range systems have been widely used for high quality RCS measurements. However the taper and cross-polarization effects can lead to significant measurement errors especially as the target approaches the border of the target zone. The taper error is mainly caused by the feed’s finite beamwidth, and the cross-polarization error by the feed’s cross-polarized radiation and the offset configuration of the reflector. A method to correct these errors is presented. In order to perform taper and cross-polarization error corrections, one has to be able to predict the target zone fields and determine the locations and complex strengths of the various scattering centers associated with the target. The correction can then be done by compensating for the taper and cross-polarization effects for each localized scattering center. Several measurements have been taken, corrected and then compared with the theoretically expected results to validate this technique.

A New implementation of the planar near-field back projection technique for phased array testing and aperture imaging
D. Garneski (Hughes Aircraft Company, Radar Systems Group), November 1990

A new implementation of the planar near-field back projection technique for phased array testing and aperture imaging is described. In the alignment of phased arrays, the aperture field is treated as a continuous distribution rather than using idealized array concepts. The continuous field is then sampled to obtain element excitations. In this way, nonrectangular arrays can easily be accommodated. The method also produces highly interpolated images of apertures that can offer much insight into their nature. Also, any polarization of the aperture field may be obtained if the probe pattern has been characterized. The technique uses large FFTs which are computed very quickly by a workstation located in the facility. Results from an iterative phase alignment of a 12x18 phased array are presented, as well as highly interpolated images of apertures and results which demonstrate the polarization selection.

Calibration techniques for compact antenna test ranges
J.A. Hammer (ESTEC), November 1990

The reflective properties of a flat circular plate and a long thin wire are discussed in connection with the quality and calibration of the quiet zone (QZ) of a compact antenna test range. (CATR). The flat plate has several applications in the CATR. The first is simple pattern analysis, which indicated errors as function of angle in the QZ, the second uses the plate as a standard gain device. The third application makes use of the narrow reflected beam of the plate to determine the direction of the incident field. The vertical wire has been used to calibrate the direction of the polarization vector. The setup of an optical reference with a theodolite and a porro prism in relation to the propagation direction of the incident field is presented as well.

Wideband polarimetric determination of antenna radiation and scattering characteristics by RCS-measurements
E. Heidrich (University Karlsruhe),W. Wiesbeck (University Karlsruhe), November 1990

A novel and very powerful measurement technique is presented which allows the determination of antenna radiation and scattering by radar-cross-section (RCS-_ measurements. The antenna under test is treated as a loaded scatterer using a polarization dependent network model that allows a complete antenna description in terms of scattered, radiated and absorbed waves. A load variation principle is used to determine the network model parameters and all commonly used antenna parameters like gain, antenna polarization, axial ratio, polarization decoupling, input impedance and also structural scattering can be derived from the backscatter measurement without using any additional standard antenna. With the antenna network description it is furthermore possible to examine the antenna behavior for arbitrary excitation or loading on their waveguide or radiation port.

Evaluation of dual-port circularly polarized probes for planar near-field measurements
M.H. Francis (National Institute of Standards and Technology),K. MacReynolds (National Institute of Standards and Technology), November 1990

Accurate near-field cross-polarization measurements on circularly polarized (CP) antennas at millimeter-wave frequencies require well-characterized probes with low axial ratios. We have recently obtained and calibrated dual-port CP horns for use as near-field probes at frequencies of 40-50 GHz. These horns have axial ratios which are 0.3 dB or less over a 10% frequency bandwidth. With these good axial ratios the difference between vector and scalar probe correction is usually small. Additional advantages of the dual-port probes are the need for only a single alignment, more accurate knowledge of the relative phase between two ports of the same probe, and the ability to obtain both main and cross polarized data during one scan. The axial ratios of the dual port CP probes are also better than those of single-port CP Probes. In this paper we present some gain, axial ratio, and pattern measurements for these probes and show that they give accurate cross-polarization measurements.

Spherical probing of spherical ranges
D.N. Black (Georgia Institute of Technology),E.B. Joy (Georgia Institute of Technology), G. Edar (Georgia Institute of Technology), M.G. Guler (Georgia Institute of Technology), R.E. Wilson (Georgia Institute of Technology), November 1990

A spherical range probing technique for the location of secondary sources in far-field compact and spherical near-field antenna measurement ranges are presented. Techniques currently used for source location use measurements of the range field on a line or plane to locate sources. A linear motion unit and possibly a polarization rotator are necessary to measure the range field in this manner. The spherical range probing technique uses measurements of the range field made on a spherical surface allowing the range positioners to be used for the range field measurement. The plane wave spectrum of the measured range field is used for source location in the spherical probing technique. Source locations in the range correspond to the locations of amplitude peaks in this spectrum. Source resolution limits of this technique is illustrated using simulated range measurements. Obtaining a plane wave spectrum from measured data is discussed.

Comparison of antenna boresight measurements between near-field and far-field ranges
A. Newell (Natl. Inst. of Standards and Tech.),J. Guerrieri (Natl. Inst. of Standards and Tech.), J.A. Stiles (Hughes Aircraft), R.R. Persinger (Comsat), Edward J. McFarlane (Hughes Aircraft), November 1989

This paper describes the results of electrical boresight measurement comparisons between one far-field and two near-field ranges. Details are given about the near-field alignment procedures and the near-field error analysis. Details of the far-field measurements and its associated errors are not described here, since the near-field technique is of primary interest. The coordinate systems of the antenna under test and the measurement ranges were carefully defined, and extreme care was taken in the angular alignment of each. The electrical boresight direction of the main beam was determined at a number of frequencies for two antenna ports with orthogonal polarizations. Results demonstrated a maximum uncertainty between the different ranges of 0.018 deg. An analytical error analysis that predicted a similar level of uncertainty was also performed. This error analysis can serve as the basis for estimating uncertainty in other near-field measurements of antenna boresight.

Improvements in polarization measurements of circularly polarized antennas
A. Newell (National Institute of Standards and Technology),D. Kremer (National Institute of Standards and Technology), J. Guerrieri (National Institute of Standards and Technology), November 1989

A new measurement technique that is used to measure the polarization properties of dual port, circularly polarized antennas is described. A three antenna technique is used, and high accuracy results are obtained for all three antennas without assuming ideal or identical properties. This technique eliminates the need for a rotating linear antenna, reduces the setup time when gain measurements are also performed, and reduces errors for antennas with low axial ratios.

Quantifying simultaneous V and H coverage from an underside aircraft location
G.J. Monser (Raytheon Company),L.T. Surrette (Raytheon Company), November 1989

This paper presents the results of a measurement program conducted to evaluate antenna coverage from a constrained-space airborne platform. Two levels of coverage are reported: Level 1 details coverage without the aircraft, but over a small groundplane, while level 2 includes aircraft effects. Coverage and gain for each polarization was evaluated by quantizing the data and computer processing to obtain a measure of goodness vs frequency. In particular, horizontal polarization showed considerable changes, as expected, compared to level 1 performance. Vertical polarization showed smaller, but significant changes.

Design development and qualification of an advanced, large compact test range
E. Dudok (Messerschmitt-Bolkow-Blohm GmbH),H-J. Steiner (Messerschmitt-Bolkow-Blohm GmbH), J. Habersack (Messerschmitt-Bolkow-Blohm GmbH), T. Fritzel (Messerschmitt-Bolkow-Blohm GmbH), November 1989

To fulfill the future demand of highly accurate antenna-, RCS- and payload testing, MBB built a new antenna test centre at Ottobrunn (Ref. 1). This paper describes the development and qualification of the large, dual reflector Compact Range (CR) which has a plane wave zone of 5.5 x 5.0 x 6.0 m (w x h x d). It starts with the results of a detailed electrical trade-off study between different CR-concepts, followed by some mechanical/thermal construction aspects of the large, highly accurate reflectors. Finally, some qualification results are shown, covering the frequency range from 3.5 GHz up to 200 GHz (lowest frequency of operation approx. 2 GHz). The achieved plane wave performance (amplitude ripple ±5o, phase ripple ±5o, cross-polarization isolation > 40 dB) verifies the high quality overall system design.

Antenna far-field pattern accuracies at millimeter wave frequencies using the planar near-field technique
M.H. Francis (National Institute of Standards and Technology), November 1989

In recent years there has been an increasing demand for antenna calibrations at millimeter wave frequencies. Because of this the National Institute of Standards and Technology (NIST) has been developing measurement capabilities at millimeter wave frequencies. The development of gain and polarization measurement capabilities have been previously reported. This paper reports on the development of the capability to measure an antenna pattern which has been achieved during the last year. Measurement accuracies of better than 4 dB have been achieved for sidelobes which are 40 dB below the mainbeam peak. NIST is now providing a new measurement service for antenna patterns in the 30-50 GHz frequency range.

Characterizing the bistatic performance of anechoic absorbers
S. Brumley (Denmar, Inc.),R.G. Immell (Motorola Govt. Elect. Group), November 1989

The requirement to measure lower radar cross-section (RCS) levels within anechoic chambers has demonstrated the need to further analyze the performance of microwave absorbers. The interactions of the feed system, compact range reflector, target mount, and target/test body with the microwave absorber greatly effect both the measurement accuracy and ambient noise level within the anechoic chamber. Better absorber characterization and understanding leads to improved chamber performance analysis and chamber design modeling. Past absorber studies have evaluated the backscatter performance of most absorber types, however, bistatic performance characterizations have been limited. This paper will discuss a method of obtaining bistatic absorber data which offers the advantages of time gating and synthetic aperture imaging to improve measurement isolation and accuracy. The approach involves illuminating a large absorber test wall about several incidence angles with the plane wave generated by a compact range. A receive antenna is then moved about the test wall and bistatic scattering is observed. The technique provides improved measurement results over methods utilizing NRL arch type systems. Bistatic absorber data has been collected and analyzed over angles from normal to near grazing incidence. Test results will be demonstrated with different absorber shapes, sizes, orientations, and material transitions from wedge to pyramidal. Various bistatic conditions will be analyzed for both polarizations over a number of frequencies.

Circularly polarized RCS measurements
T.S. Watson (Texas Instruments Incorporated), November 1989

Circularly polarized radar cross-section (RCS) measurements place stringent requirements on an RCS range. Indoor compact ranges without the problems of ground reflections have the potential of making accurate circular polarization (CP) measurements. A simple method for CP RCS measurements is described using broadband meander-line polarizers over the compact range feed horns. Axial ratio and differential phase measurements were performed to evaluate the polarizer fabrication accuracy. Basic scattering shapes were measured to test the performance of the CP measurement system. Comparison of CP measurements with analytical predictions demonstrated the success and limitations of the technique.

Automated millimeter wave evaluation system for advanced materials and frequency selective surfaces
W.S. Arceneaux (Martin Marietta Electronics & Missiles Group), November 1989

An automated instrumentation system has been configured for the purpose of evaluating advanced composites, radar absorbing materials, and frequency selective surfaces (FSS) in free space. Electrical test frequencies are divided into three bands that range from 18 to 60 GHz for any linear polarization. Software has been incorporated to calculate dielectric properties from the measured transmission and reflection characteristics. Using the HP9836 computer, software was written to automate and integrate the Anorad 3253 positioner with the HP8510 network analyzer. This system allows for the input of up to five incident angles at vertical, horizontal, and cross polarization. The measured transmission loss (amplitude and phase) at multiple incident angles is then plotted for comparison. This paper gives a complete description of the system configuration, calibration techniques, and samples of output data. Material properties are computed and compared to specified and theoretical values. Measured results of an FSS structure are compared to its predicted response.

A Hand held microwave reflectometer
D. Slater (Nearfield Systems Incorporated),G. Hindman (Nearfield Systems Incorporated), November 1989

Measurements of the microwave reflectivity of materials is often performed with complex test setups using probes attached to a vector network analyzer. The lack of portability of these systems prevents the user from measuring reflective properties of surfaces that are not easily moved to an appropriate test facility. This paper describe a small, hand held microwave reflectometer which is designed to perform rapid reflectivity measurements in the field. The reflectometer consists of a tuneable Ku band source, a dual polarization sampling horn, a pair of crystal detectors, and a battery powered microcomputer.







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